Keysight’s PZ2100 Series is racking up success stories. Check out this one.
Success Stories #8: Fast and Accurate Reliability Test for Memories (DRAM and NAND)
CUSTOMER
Modeling R&D at a world leader in semiconductor memory chips
APPLICATION
Semiconductor memories (DRAM and NAND): To extract SPICE model parameters and ensure real data.
NEEDS
To create accurate SPICE models:
- Precise static I/V measurements down to 1 pA to characterize MOSFET’s parameters (I/V curve, Vth, Idlin, Idsat, etc.).
- Fast reliability test (fast pulsed I/V measurements with 30 us pulse width) to evaluate an actual operating condition of the DRAM/NAND array.
SOLUTION
2 sets of (PZ2100A + PZ2110A x1 + PZ2121A x2)
- PZ2110A is mainly used for precise static I/V measurements.
- PZ2121A is mainly used for fast reliability tests.
- The customer will plan to use the PZ2100 at their production line in the future.
WHY BUY?
Higher accuracy and faster speed compared to status quo (x10 times more accurate measurements in the low current area under the same test conditions).